Advances in Electronics and Electron Physics, Volumen 81Academic Press, 2 dic 1991 - 342 páginas Advances in Electronics and Electron Physics |
Índice
1 | |
43 | |
Pioneer of Electron Microscopy | 127 |
177 | |
Chapter 5 Electron Microscopy in Berlin 19281945 | 211 |
Otras ediciones - Ver todo
Advances in Electronics and Electron Physics Peter W. Hawkes No hay ninguna vista previa disponible - 1991 |
Términos y frases comunes
aberration coefficients applications Ardenne atomic Berlin Bodo von Borries Boersch Borries and Ruska calculated canonical aberration theory charge chromatic aberration cross-section density diaphragm diffraction patterns discussed Düsseldorf edge EELS elastic electromagnetic electron beam optics electron microscopy electron optics electrostatic Elektronenmikroskop energy loss AE equation Ernst Ruska field filter lens Gaussian Hamiltonian Helmut Ruska image intensifier image plane increasing inelastically scattered inelastically scattered electrons Institute integral intensity ionization Knoll laboratory lectures lenses magnetic magnification Mahl mass thickness matrix method Micr mode mrad objective aperture obtained optical system Optik optimization oscillograph parameters phase Phys plasmon losses Poisson bracket potential primary beam probe Professor radius Reimer scanning scattering angles Section Shao shows Siemens ſº specimen spectrometer spherical aberration surface trajectory transmission electron microscope Ultramicroscopy unfiltered VA/V values voltage Wien filter Wolpers Ximen zero-loss filtered